FT160

Fast, accurate analysis of nanoscale coatings

The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
The FT160’s poly capillary optics can measure nm-scale coatings on features smaller than 50 µm, and advanced detector technology gives you high accuracy while maintaining a short measurement time. Other features, such as a large sample table, wide opening door, high-definition sample camera, and a substantial observation window, make it easy to load items of varying sizes and find the region of interest on a large substrate. Easy to use, this analyzer integrates seamlessly with your QA/QC process, alerting you to issues before they become a crisis.

Product Highlights:
Designed for microspot and ultra-thin coatings analysis, the FT160’s optics and detector technology are optimized for the smallest of features.
• Large observation window for viewing analysis from a safe distance
• Measurement methods meet standards ISO 3497, ASTM B568, and DIN 50987
• Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity
• Automated feature location for fast sample setup
• Choice of analyzer configuration optimized for your application
• Measure nm-scale coatings on features smaller than 50 µm
• Double the analysis throughput of conventional instruments
• Accommodates large samples in a wide range of shapes
• Robust design tested for long-term production use